Development of AI algorithms and statistical methods for Electrical Wafer Sorting analysis processes enhancement and automation
Setup and PAT issues are the main sources of yield, efficiency, and quality loss in EWS and spotting them in real-time is almost impossible due to the high volume of products tested. This project aims to automize and innovate EWS technology, by implementing a combination of AI methods and computational algorithms to achieve a real-time automatic analysis of all the tested silicon wafers lots, as well as an early detection of any setup issues and automatic decision-making capabilities.
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