Experimental and modeling investigation of the Temperature and Moisture Dependence of the Time-Dependent-Dielectric Breakdown (TDDB) in Polymeric Dielectrics for Galvanic Isolation Devices
The research activities showed, for the first time, a non-monotonic temperature dependence of the time-to-breakdown of polymeric dielectrics. The results were traced back to variations of the moisture content of the dielectric during the TDDB experiment and an effective numerical model was developed to support that physical picture. From this achievement, the model was extended to reproduce the peculiar lifetime dependence of the samples on their moisture content.
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